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Cluster Secondary Ion Mass Spectrometry
- Principles and Applications
Engelsk Hardback
Cluster Secondary Ion Mass Spectrometry
- Principles and Applications
Engelsk Hardback

1.326 kr
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Om denne bog
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.
Product detaljer
Sprog:
Engelsk
Sider:
380
ISBN-13:
9780470886052
Indbinding:
Hardback
Udgave:
ISBN-10:
0470886056
Udg. Dato:
28 jun 2013
Længde:
21mm
Bredde:
243mm
Højde:
165mm
Forlag:
John Wiley & Sons Inc
Oplagsdato:
28 jun 2013
Forfatter(e):
Kategori sammenhænge