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Noise in Nanoscale Semiconductor Devices
Engelsk Paperback
Noise in Nanoscale Semiconductor Devices
Engelsk Paperback

811 kr
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Om denne bog

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices.  Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models.  Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects.

  • Describes the state-of-the-art, regarding noise in nanometer semiconductor devices;
  • Enables readers to design more reliable semiconductor devices;
  • Offers the most up-to-date information on point defects, based on physical microscopic models.

Product detaljer
Sprog:
Engelsk
Sider:
729
ISBN-13:
9783030375027
Indbinding:
Paperback
Udgave:
ISBN-10:
3030375021
Udg. Dato:
27 apr 2021
Længde:
0mm
Bredde:
155mm
Højde:
235mm
Forlag:
Springer Nature Switzerland AG
Oplagsdato:
27 apr 2021
Forfatter(e):
Kategori sammenhænge