Store besparelser
Hurtig levering
Gemte
Log ind
0
Kurv
Bøger
Bestsellers
Kommer snart
Nyheder
Spil og hobby
Hjem
Kategorier
Bestsellers
Kommer snart
Nyheder
FAQ
Konto
Kontakt
Kurv
  1. Bog
  2. Elektronik teknik
  3. Elektronik: kredse og komponenter

Design for Testability, Debug and Reliability

- Next Generation Measures Using Formal Techniques
Af: Rolf Drechsler, Sebastian Huhn Engelsk Paperback

Design for Testability, Debug and Reliability

- Next Generation Measures Using Formal Techniques
Af: Rolf Drechsler, Sebastian Huhn Engelsk Paperback
Tjek vores konkurrenters priser

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

Vis mere
Tjek vores konkurrenters priser
Normalpris
kr 1.002
Fragt: 39 kr
6 - 8 hverdage
20 kr
Pakkegebyr
God 4 anmeldelser på
Tjek vores konkurrenters priser

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

Vis mere
Se mere i:
Produktdetaljer
Sprog: Engelsk
Sider: 164
ISBN-13: 9783030692117
Indbinding: Paperback
Udgave:
ISBN-10: 3030692116
Kategori: Elektronik: kredse og komponenter
Udg. Dato: 20 apr 2022
Længde: 0mm
Bredde: 155mm
Højde: 235mm
Forlag: Springer Nature Switzerland AG
Oplagsdato: 20 apr 2022
Forfatter(e): Rolf Drechsler, Sebastian Huhn
Forfatter(e) Rolf Drechsler, Sebastian Huhn

Kategori Elektronik: kredse og komponenter

ISBN-13 9783030692117

Sprog Engelsk

Indbinding Paperback

Sider 164

Udgave

Længde 0mm

Bredde 155mm

Højde 235mm

Udg. Dato 20 apr 2022

Oplagsdato 20 apr 2022

Forlag Springer Nature Switzerland AG

Kategori sammenhænge