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Advanced Materials Characterization

- Basic Principles, Novel Applications, and Future Directions

Advanced Materials Characterization

- Basic Principles, Novel Applications, and Future Directions
Tjek vores konkurrenters priser

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

Features:

  • Covers material characterization techniques and the development of advanced characterization technology
  • Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
  • Discusses advanced material characterization technology in the microstructural and property characterization fields
  • Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
  • Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.

Tjek vores konkurrenters priser
Normalpris
kr 488
Fragt: 39 kr
6 - 8 hverdage
20 kr
Pakkegebyr
God 4 anmeldelser på
Tjek vores konkurrenters priser

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

Features:

  • Covers material characterization techniques and the development of advanced characterization technology
  • Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
  • Discusses advanced material characterization technology in the microstructural and property characterization fields
  • Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
  • Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.

Produktdetaljer
Sprog: Engelsk
Sider: 130
ISBN-13: 9781032375113
Indbinding: Paperback
Udgave:
ISBN-10: 1032375116
Udg. Dato: 29 nov 2024
Længde: 11mm
Bredde: 234mm
Højde: 156mm
Forlag: Taylor & Francis Ltd
Oplagsdato: 29 nov 2024
Forfatter(e) Ch Sateesh Kumar, Ram Krishna, M. Muralidhar Singh


Kategori Spektralanalyse, spektrokemi, massespektrometri


ISBN-13 9781032375113


Sprog Engelsk


Indbinding Paperback


Sider 130


Udgave


Længde 11mm


Bredde 234mm


Højde 156mm


Udg. Dato 29 nov 2024


Oplagsdato 29 nov 2024


Forlag Taylor & Francis Ltd