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Scanning Electron Microscopy and X-Ray Microanalysis
- Third Edition
Engelsk Hardback
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Scanning Electron Microscopy and X-Ray Microanalysis
- Third Edition
Engelsk Hardback

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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Product detaljer
Sprog:
Engelsk
Sider:
689
ISBN-13:
9780306472923
Indbinding:
Hardback
Udgave:
ISBN-10:
0306472929
Kategori:
Udg. Dato:
31 jan 2003
Længde:
38mm
Bredde:
178mm
Højde:
255mm
Forlag:
Springer Science+Business Media
Oplagsdato:
31 jan 2003
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