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Noise Contamination in Nanoscale VLSI Circuits

Af: Selahattin Sayil Engelsk Paperback

Noise Contamination in Nanoscale VLSI Circuits

Af: Selahattin Sayil Engelsk Paperback
Tjek vores konkurrenters priser
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
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This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
Produktdetaljer
Sprog: Engelsk
Sider: 136
ISBN-13: 9783031127533
Indbinding: Paperback
Udgave:
ISBN-10: 3031127536
Udg. Dato: 2 sep 2023
Længde: 0mm
Bredde: 168mm
Højde: 240mm
Forlag: Springer International Publishing AG
Oplagsdato: 2 sep 2023
Forfatter(e): Selahattin Sayil
Forfatter(e) Selahattin Sayil


Kategori Elektronik: kredse og komponenter


ISBN-13 9783031127533


Sprog Engelsk


Indbinding Paperback


Sider 136


Udgave


Længde 0mm


Bredde 168mm


Højde 240mm


Udg. Dato 2 sep 2023


Oplagsdato 2 sep 2023


Forlag Springer International Publishing AG