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Multi-run Memory Tests for Pattern Sensitive Faults
Engelsk Paperback

Multi-run Memory Tests for Pattern Sensitive Faults

Engelsk Paperback

429 kr
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Om denne bog

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.  The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.

  • Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;
  • Presents practical algorithms for design and implementation of efficient multi-run tests;
  • Demonstrates methods verified by analytical and experimental investigations.




Product detaljer
Sprog:
Engelsk
Sider:
135
ISBN-13:
9783030081980
Indbinding:
Paperback
Udgave:
ISBN-10:
3030081982
Udg. Dato:
1 feb 2019
Længde:
0mm
Bredde:
155mm
Højde:
235mm
Forlag:
Springer Nature Switzerland AG
Oplagsdato:
1 feb 2019
Forfatter(e):
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